Thin Film Metrology - TFR



Axic Precision P-1000

The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor,
magnetic and applications.

This fully automatic system provides rapid composition and thickness analysis of films in the production environment. In process development, the Precision P-1000 is utilized to characterize the effect of variables on the film deposition process. Once the process is defined, the Precision P-1000 is utilized as a quality control monitor to insure the composition and thickness of the production films.

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